S.G. Urquhart, 2022, X-ray Spectroptychography, ACS Omega 7(14) 11521-11529 DOI: 10.1021/acsomega.2c00228 Accepted March 16, 2022.
S.G. Urquhart, M. Martinson, S. Eger, V. Murcia, H. Ade, and B.A. Collins, 2017. Connecting Molecular Conformation to Aggregation in P3HT Using Near Edge X-ray Absorption Fine Structure Spectroscopy, J. Phys. Chem. C, 121, 21720021728. DOI: 10.1021/acs.jpcc.7b07143
A.Ritchie, W. Cao, M. Dasog, T.K. Purkait, C. Senger, Y.F. Hu, Q.F. Xiao, J.G.C. Veinot and S.G. Urquhart, 2016. Silicon 1s near edge X-ray absorption fine structure spectroscopy of functionalized silicon nanocrystals.The Journal of Chemical Physics, 145, 154703. http://dx.doi.org/10.1063/1.4964371
Andrew Ritchie, Shaylin Eger, Chelsey Wright, Daniel Chelladurai, Cuyler Borrowman, Weine Olovsson, Martin Magnuson, Jai Verma, Debdeep Jena, Huili Grace Xing, Christian Dubuc, Stephen Urquhart*, Strain Sensitivity in the Nitrogen 1s NEXAFS Spectra of Gallium Nitride, 2014. Applied Surface Science. 316: 232-246. DOI: 10.1016/j.apsusc.2014.07.070
M. Masnadi and S.G. Urquhart*, 2013, Indirect Molecular Epitaxy: Deposition of n-Alkane Thin Films on Au coated NaCl(001) and HOPG(0001) Surfaces, Langmuir. 29: 6302-6307. DOI: 10.1021/la304944k
W. Cao, M. Masnadi, S. Eger, M. Martinson, Q.-F. Xiao, Y.-F. Hu, J.-M. Baribeau, J.C. Woicik, A.P. Hitchcock, S.G. Urquhart, 2013. Quantification of strain through linear dichroism in the Si 1s edge X-ray absorption spectra of strained Si1−xGex thin films. Applied Surface Science. 265: 358-362 DOI: 10.1016/j.apsusc.2012.11.012
