Surface Characterization

The surface characterization division consists of a state of the art STM/AFM surface science system currently undergoing commissioning for use in research by Jay Forrest, with summer student Barry Tran. It is located in the basement of the Department of Physics and Engineering Physics at the University of Saskatchewan. The system includes an ultra high vacuum variable temperature scanning tunneling microscope as well as an attached preparation and characterization system. The characterization system includes AFM, LEED, mass spectrometer, and Auger electron spectroscopy equipment. This system will be used to image organic and spintronic materials to learn about their electronic properties.

This system has the capability to:
  • Perform Scanning Tunneling Microscopy measurements including tip preparation.
  • Perform Atomic Force Microscopy Measurements including contact mode imaging, non-contact and tapping modes, and force modulation imaging.

Projects in Progress:
- AFM upgrades for force modulation system

Organic Spin-coating

Organic thin film coating division consists of a spin coating system used for solution processing of organic materials. This facility is used to make thin films using a variety of substrates and solvents at room temperature. This system is fully operational and samples produced with the equipment have been measured with X-ray spectroscopy at the Canadian Light Source and Advanced Light Source at Berkeley labs, CA, as well as imaged with the AFM system described above. Currently under study are a set of molecules which are highly soluble and show desirable device characteristics such as high charge carrier mobility when they are prepared as spin-coated thin films. 

Projects in Progress:
- Spin coating of materials for photovoltaics

Thin Film Fabrication

The physical vapour deposition (PVD) equipment is available for fabrication of various thin films. This system is designed to deposit both metals and organic materials using vapor deposition under high vacuum. The system is configured with 6 vacuum evaporation sources giving it the capability to deposit metals and organic materials simultaneously to create metal-doped organic materials. It may be used to fabricate new types of TFT and photovoltaic devices made using organic materials. Complementary to this system is additional equipment for measurement of I-V and C-V characteristics of TFTs and photovoltaics.

This system has the capability to:
  • Deposit thin films of metals and organic materials by vapor deposition.
  • Measure I-V and C-V characteristics of thin film transistor devices
  • Measure I-V characteristics of photovoltaic devices.

Projects in Progress:
- Sample Preparation for Spectroscopy Measurements
- Construction of Devices

Device Characterization

Solar Simulator and MOKE

The Device Characterization Division consists of a solar simulator and I-V measurement probe station, recently a Magneto-optic Kerr effect (MOKE) measurement system. The solar simulator is used for determining the power conversion efficiency of photovoltaic devices in conjunction with the probe station which is also equipped to measure the I-V curve of transistor devices. The MOKE is used to investigate the magnetization of materials.